When continuously improving, have you spent lots of time organizing data scattered all over the place for root causes finding?
How to identify variables of significance among the various variables,?
Greatly enhancing yield rates and production efficiencyWithout good SPC tools holistically monitoring in real time, how much unnecessary losses will cost?
Why are some data just unable to get into your SPC system?
Lots of sensors are deployed to the machines,
what is the most effective way to utilize such massive amounts of data?
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AYEDAS
Advanced Yield Enhancement Data Analysis SystemA solution that can identify yield rate problems in the fastest manner-monitors all factors impacting quality and yield rates efficiently and accurately.
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Premium SPC
Statistical Process ControlQuality parameter monitoring and anomaly management in the production process.
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LRCS
Lot Review and Comparison SystemA comprehensive analysis system most suitable for the IC design industry and testing industry for test data integration.
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EEAS
Equipement Engineering Analysis SystemReal-time machine anomaly monitoring allows fast yield rate improvement.
TYNE - Leading brand of engineering data analysis and yield management systems.
At present, more than 100 factories in the ICT industry use the products of TYNE.
- Semiconductor Industry
- Optoelectronics Industry
- Others
